From nde-owner Thu Jan 24 13:22:18 2002 Received: from bams (localhost [127.0.0.1]) by coqui.ccf.swri.edu (8.11.2/8.11.2) with ESMTP id g0OJMIK24976 for ; Thu, 24 Jan 2002 13:22:18 -0600 (CST) Received: from mpicon ([129.162.226.19]) by bams.ccf.swri.edu (iPlanet Messaging Server 5.1 (built Sep 5 2001)) with SMTP id <0GQG003AKJ533Q@bams.ccf.swri.edu> for nde@coqui.ccf.swri.edu; Thu, 24 Jan 2002 13:22:16 -0600 (CST) Date: Thu, 24 Jan 2002 13:22:11 -0600 From: "Martin B. Picon" To: nde@coqui.ccf.swri.edu Message-id: MIME-version: 1.0 X-MIMEOLE: Produced By Microsoft MimeOLE V5.50.4807.1700 X-Mailer: Microsoft Outlook IMO, Build 9.0.2416 (9.0.2911.0) Content-type: text/plain; charset=iso-8859-1 Content-transfer-encoding: 7BIT Importance: Normal X-Priority: 3 (Normal) X-MSMail-priority: Normal Subject: [NDE] Test Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Non Destructive Evaluation (NDE) List-Unsubscribe: , List-Archive: ----------------------------- Martin B. Picon Southwest Research Institute, Information Technology Center Voice: (210) 522-2717 E-mail: mpicon@swri.edu From nde-owner Fri Jan 25 16:18:47 2002 Received: from bams (localhost [127.0.0.1]) by coqui.ccf.swri.edu (8.11.2/8.11.2) with ESMTP id g0PMIlK23085 for ; Fri, 25 Jan 2002 16:18:47 -0600 (CST) Received: from mpicon ([129.162.226.19]) by bams.ccf.swri.edu (iPlanet Messaging Server 5.1 (built Sep 5 2001)) with SMTP id <0GQI00E5MLZA46@bams.ccf.swri.edu> for nde@coqui.ccf.swri.edu; Fri, 25 Jan 2002 16:18:46 -0600 (CST) Date: Fri, 25 Jan 2002 16:18:46 -0600 From: "Martin B. Picon" To: nde@coqui.ccf.swri.edu Message-id: MIME-version: 1.0 X-MIMEOLE: Produced By Microsoft MimeOLE V5.50.4807.1700 X-Mailer: Microsoft Outlook IMO, Build 9.0.2416 (9.0.2911.0) Content-type: text/plain; charset=iso-8859-1 Content-transfer-encoding: 7BIT Importance: Normal X-Priority: 3 (Normal) X-MSMail-priority: Normal Subject: [NDE] Test Message - Please Ignore Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Non Destructive Evaluation (NDE) List-Unsubscribe: , List-Archive: ----------------------------- Martin B. Picon Southwest Research Institute, Information Technology Center Voice: (210) 522-2717 E-mail: mpicon@swri.edu From nde-admin@coqui.ccf.swri.edu Sat Jan 26 11:40:52 2002 Path: sn-us!sn-xit-02!supernews.com!postnews1.google.com!not-for-mail From: gergana.genova@metalife.de (Gergana Genova) Newsgroups: sci.techniques.testing.nondestructive Date: 26 Jan 2002 09:35:38 -0800 Organization: http://groups.google.com/ Lines: 19 Message-ID: NNTP-Posting-Host: 212.95.170.165 Content-Type: text/plain; charset=ISO-8859-1 Content-Transfer-Encoding: 8bit X-Trace: posting.google.com 1012066539 27751 127.0.0.1 (26 Jan 2002 17:35:39 GMT) X-Complaints-To: groups-abuse@google.com NNTP-Posting-Date: 26 Jan 2002 17:35:39 GMT Xref: sn-us sci.techniques.testing.nondestructive:5723 To: nde@coqui.ccf.swri.edu Subject: [NDE] New BIOINFORMATICS Resource Launched! Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Non Destructive Evaluation (NDE) List-Unsubscribe: , List-Archive: Dear Coleagues, In the beginning of the year 2002 a team of biologists and programmers launched new FREE bioinformatics resource. This site offers: - collected information in searchable databases [incl. GBK, SPRT, PIR and many of major databases available]; - Algorithms [Blast, ClustlW, 3D modeler, 2D Prediction and many others] - User can save their files generated by algorithms and search processes. You can find these resources at the following address: http://www.metalife.de Feel free to contact METALIFE team. Best Regards Gergana Genova METALIFE From nde-owner Tue Jan 29 05:20:50 2002 Received: from viruswall.ccf.swri.edu (localhost [127.0.0.1]) by coqui.ccf.swri.edu (8.11.2/8.11.2) with ESMTP id g0TBKlr24149 for ; Tue, 29 Jan 2002 05:20:49 -0600 (CST) Received: from mailhub.ccf.swri.edu (localhost [127.0.0.1]) by viruswall.ccf.swri.edu (8.10.2+Sun/8.10.2) with ESMTP id g0TBKkV19693 for ; Tue, 29 Jan 2002 05:20:46 -0600 (CST) Received: from daffodil.csv.warwick.ac.uk (daffodil.csv.warwick.ac.uk [137.205.192.30]) by mailhub.ccf.swri.edu (8.11.2/8.11.2) with ESMTP id g0TBKk825189 for ; Tue, 29 Jan 2002 05:20:46 -0600 (CST) Received: from pansy.csv.warwick.ac.uk (root@pansy [137.205.192.19]) by daffodil.csv.warwick.ac.uk (8.11.6/8.11.6) with ESMTP id g0TBKfn07962 for ; Tue, 29 Jan 2002 11:20:41 GMT Received: from HOST (pces705 [137.205.146.193]) by pansy.csv.warwick.ac.uk (8.11.6/8.11.6) with SMTP id g0TBKe900978 for ; Tue, 29 Jan 2002 11:20:40 GMT Date: Tue, 29 Jan 2002 11:20:40 GMT From: Mr D Choi Message-Id: <200201291120.g0TBKe900978@pansy.csv.warwick.ac.uk> To: nde@coqui.ccf.swri.edu Subject: [NDE] new photos from my party! Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: ------------------ Virus Warning Message (on viruswall) Found virus WORM_MYPARTY.A in file www.myparty.yahoo.com The uncleanable file www.myparty.yahoo.com is moved to /etc/iscan/virus/virVUD8HbGps. --------------------------------------------------------- Hello! My party... It was absolutely amazing! I have attached my web page with new photos! If you can please make color prints of my photos. Thanks! ------------------ Virus Warning Message (on viruswall) www.myparty.yahoo.com is removed from here because it contains a virus. --------------------------------------------------------- From nde-owner Tue Jan 29 05:20:52 2002 Received: from viruswall.ccf.swri.edu (localhost [127.0.0.1]) by coqui.ccf.swri.edu (8.11.2/8.11.2) with ESMTP id g0TBKq224154 for ; Tue, 29 Jan 2002 05:20:52 -0600 (CST) Received: from localhost (root@localhost) by viruswall.ccf.swri.edu (8.10.2+Sun/8.10.2) with SMTP id g0TBKps19700 for ; Tue, 29 Jan 2002 05:20:52 -0600 (CST) Date: Tue, 29 Jan 2002 05:20:52 -0600 (CST) Message-Id: <200201291120.g0TBKps19700@viruswall.ccf.swri.edu> From: root@viruswall.ccf.swri.edu To: nde@coqui.ccf.swri.edu Mime-Version: 1.0 Content-Type: text/plain; charset=us-ascii Content-Transfer-Encoding: 7bit Subject: [NDE] Virus Alert Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: VirusWall has detected a virus (WORM_MYPARTY.A) in a message sent to you from d.w.choi@warwick.ac.uk at 01/29/2002 05:20:46. The action was quarantined. From nde-admin@coqui.ccf.swri.edu Sat Feb 2 13:25:06 2002 Path: sn-us!sn-xit-03!supernews.com!logbridge.uoregon.edu!gestalt.direcpc.com!news.stealth.net!newscon02.news.prodigy.com!newsmst01.news.prodigy.com!prodigy.com!postmaster.news.prodigy.com!newssvr30.news.prodigy.com.POSTED!not-for-mail From: Neil L Chavigny Newsgroups: sci.techniques.testing.nondestructive Organization: Radio Ranch User-Agent: MT-NewsWatcher/3.0 (PPC) Message-ID: Lines: 31 NNTP-Posting-Host: 216.61.40.219 X-Complaints-To: abuse@prodigy.net X-Trace: newssvr30.news.prodigy.com 1012677609 ST000 216.61.40.219 (Sat, 02 Feb 2002 14:20:09 EST) NNTP-Posting-Date: Sat, 02 Feb 2002 14:20:09 EST X-UserInfo1: TSUGWWGDTRVWRZLSN[OJNW@@YJ_ZTB\MV@BNMRQIMASJETAANVW[AKWZE\]^XQWIGNE_[EBL@^_\^JOCQ^RSNVLGTFTKHTXHHP[NB\_C@\SD@EP_[KCXX__AGDDEKGFNB\ZOKLRNCY_CGG[RHT_UN@C_BSY\G__IJIX_PLSA[CCFAULEY\FL\VLGANTQQ]FN Date: Sat, 02 Feb 2002 19:20:09 GMT Xref: sn-us sci.techniques.testing.nondestructive:5728 To: nde@coqui.ccf.swri.edu Subject: [NDE] FS Falex Tribology Test Device Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: I have one Falex multi Specimen testing device that is surplus to my needs. The model is Multi Specimen and is a current model that qualifies for any manufacturers support. This unit is in excellent operational and includes three units. The main test device, the controller and the chart drive. Photos can be seen at: http://www.radioranch.com/falex/ I do not have tooling of accesories, weights or manuals. All of these accesories are available from Falex. I am asking $9500.00 OBO. Falex wants $20K for a refurbed unit. Please E-Mail with questions Neil L Chavigny -- Radio Ranch Neil L. Chavigny Austin, Texas 512 459 6855 From nde-admin@coqui.ccf.swri.edu Thu Feb 7 12:05:04 2002 Path: sn-us!sn-xit-03!supernews.com!nntp.cs.ubc.ca!cyclone.mw.ipsvc.net!news.mw.ipsvc.net!typhoon.mn.ipsvc.net.POSTED!not-for-mail From: "Nick Bauer" Newsgroups: sci.geo.petroleum,sci.techniques.testing.nondestructive Lines: 30 X-Priority: 3 X-MSMail-Priority: Normal X-Newsreader: Microsoft Outlook Express 5.50.4522.1200 X-MimeOLE: Produced By Microsoft MimeOLE V5.50.4910.0300 Message-ID: <1iz88.1153$sg.138438@typhoon.mn.ipsvc.net> Date: Thu, 07 Feb 2002 18:01:33 GMT NNTP-Posting-Host: 24.118.107.21 X-Complaints-To: abuse@attbroadband.com X-Trace: typhoon.mn.ipsvc.net 1013104893 24.118.107.21 (Thu, 07 Feb 2002 12:01:33 CST) NNTP-Posting-Date: Thu, 07 Feb 2002 12:01:33 CST Xref: sn-us sci.geo.petroleum:21635 sci.techniques.testing.nondestructive:5730 To: nde@coqui.ccf.swri.edu Subject: [NDE] US-MN Refinery Inspector Needed Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: Immediate need for a Refinery Inspector. This position is open at a beverage company Near the Mall of America in Bloomington, Minnesota. Please send a resume in a word document with your current salary and your salary expectations. 60-80K base but flex. Need someone yesterday. Here is a brief description of what I'm looking for Refinery Inspector API - American Petroleum Institute IPPI - 570 API - 653 API - 510 RBI Software (Risk Based Inspection) NDT - Non Destructive Testing Fixed Equipment Please send a Word Document Resume Nick Bauer Recruiter Bauer Resource Group, Inc. Cottage Grove, MN mailto:nickbauer@mediaone.net Your Staffing Solutions Provider From nde-admin@coqui.ccf.swri.edu Fri Feb 8 06:40:20 2002 Path: sn-us!sn-xit-03!supernews.com!nntp.cs.ubc.ca!news-spur1.maxwell.syr.edu!news.maxwell.syr.edu!feed2.news.rcn.net!rcn!chnws02.mediaone.net!cyclone.ne.ipsvc.net!24.128.8.70!typhoon.ne.ipsvc.net.POSTED!not-for-mail From: John Seney Newsgroups: sci.techniques.testing.nondestructive User-Agent: MT-NewsWatcher/3.0 (PPC) Message-ID: Lines: 1 Date: Fri, 08 Feb 2002 12:34:54 GMT NNTP-Posting-Host: 24.147.76.157 X-Complaints-To: abuse@mediaone.net X-Trace: typhoon.ne.ipsvc.net 1013171694 24.147.76.157 (Fri, 08 Feb 2002 07:34:54 EST) NNTP-Posting-Date: Fri, 08 Feb 2002 07:34:54 EST Organization: ATT Broadband Xref: sn-us sci.techniques.testing.nondestructive:5731 To: nde@coqui.ccf.swri.edu Subject: [NDE] Pointer to Scope.FAQ Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: http://www.qsl.net/wd1v/scopefaq/index1.html From nde-admin@coqui.ccf.swri.edu Fri Feb 15 06:10:08 2002 Path: sn-us!sn-xit-02!supernews.com!postnews1.google.com!not-for-mail From: exp127@physik.uni-kiel.de (Frank Bock) Newsgroups: sci.techniques.testing.nondestructive Date: 15 Feb 2002 04:01:56 -0800 Organization: http://groups.google.com/ Lines: 41 Message-ID: <8434d61a.0202150401.1fd08339@posting.google.com> NNTP-Posting-Host: 217.70.192.8 Content-Type: text/plain; charset=ISO-8859-1 Content-Transfer-Encoding: 8bit X-Trace: posting.google.com 1013774517 13191 127.0.0.1 (15 Feb 2002 12:01:57 GMT) X-Complaints-To: groups-abuse@google.com NNTP-Posting-Date: 15 Feb 2002 12:01:57 GMT Xref: sn-us sci.techniques.testing.nondestructive:5732 To: nde@coqui.ccf.swri.edu Subject: [NDE] Virtual NDT opening new dimensions of training - www.yxlon.info Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: COMCITY AG, Kiel and YXLON International, Hamburg have proved today that learning can be more than just swotting boring theory. Together, both companies made up a world of learning, whose highlight a web-based training of x-ray imaging is. X-ray units for non-destructive material testing belong to the category of industrial plants, whose operators need theoretical and practical knowledge in order to handle them. These operators have to be trained in special courses that need a lot of time and are very expensive. In search of a partner, who is capable of realizing such training via internet and being able to make the practical work possible, the world market leader in the sector of real-time x-ray imaging, YXLON International, met COMCITY AG and their concept of virtual products. Virtual products give you the possibility to use devices via internet – anytime and anywhere. The principle of “clicking, downloading and working”, which was limited to software so far, has now been transferred to hardware by COMCITY AG. There is no need for the user of going to the device, the device comes to him. New ways of added value are created, not only for training but also for marketing, sales department and support. “Try before you buy” is only one possibility. COMCITY AG has realised the real-time x-ray imaging as a virtual product for this online course: the user can choose the object he wants to analyse, put it into the examination chamber and search for material defects. With the different exercises, the user gets to know the significance of amperage, voltage, filters or the size of the focal spot for the x-ray image. The necessary knowledge about the synthesis of x-rays, the legal provisions and radiation protection is imparted during the eight chapters of the theoretical part. The possibility of self control of success in learning completes the offer. A course can be booked for the duration of 4 weeks. If you want to try it first, you can do it free of charge in a special testing room. There you can already work with the x-ray unit. You can view our new product at www.yxlon.info From nde-admin@coqui.ccf.swri.edu Sat Feb 16 08:45:10 2002 Path: sn-us!sn-xit-03!supernews.com!newsswitch.lcs.mit.edu!newsfeed.cwix.com!newscon02.news.prodigy.com!newsmst01.news.prodigy.com!prodigy.com!postmaster.news.prodigy.com!newssvr30.news.prodigy.com.POSTED!not-for-mail From: Neil L Chavigny Newsgroups: sci.techniques.testing.nondestructive Organization: Radio Ranch User-Agent: MT-NewsWatcher/3.0 (PPC) Message-ID: Lines: 24 NNTP-Posting-Host: 216.61.40.219 X-Complaints-To: abuse@prodigy.net X-Trace: newssvr30.news.prodigy.com 1013870474 ST000 216.61.40.219 (Sat, 16 Feb 2002 09:41:14 EST) NNTP-Posting-Date: Sat, 16 Feb 2002 09:41:14 EST X-UserInfo1: FKPO@MC@@S@UCRLYLRKV^^UDFRYB@GXLN@GZ_GYO^BVNDQUBLNTC@AWZWDXZXQ[K\FFSKCVM@F_N_DOBWVWG__LG@VVOIPLIGX\\BU_B@\P\PFX\B[APHTWAHDCKJF^NHD[YJAZMCY_CWG[SX\Y]^KC\HSZRWSWKGAY_PC[BQ[BXAS\F\\@DMTLFZFUE@\VL Date: Sat, 16 Feb 2002 14:41:14 GMT Xref: sn-us sci.techniques.testing.nondestructive:5733 To: nde@coqui.ccf.swri.edu Subject: [NDE] Unholtz Dickie Vibration System FS/NEW Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: I have one Unholtz Dickie shake system that is surplus to my needs. Photos can be seen at: http://www.radioranch.com/Unholtz/ It was delivered new in April, 2001 and was never installed. The system includes the TA250 amp, SO32 Shaker, Blower, VWIN workststion w/version 4.5 of the shake program, manuals & software CD. Everything that is needed for installation. Unholtz Dickies price is around $50K. Looking for $17500.00 OBO. Thanks, Neil L. Chavigny -- Radio Ranch Neil L. Chavigny Austin, Texas 512 459 6855 From nde-admin@coqui.ccf.swri.edu Mon Feb 18 10:15:07 2002 Path: sn-us!sn-xit-02!supernews.com!postnews1.google.com!not-for-mail From: weidongzhu@hotmail.com (WeiDong Zhu) Newsgroups: sci.techniques.testing.nondestructive Date: 18 Feb 2002 08:07:25 -0800 Organization: http://groups.google.com/ Lines: 8 Message-ID: <986afd1f.0202180807.53d23b9d@posting.google.com> NNTP-Posting-Host: 155.246.1.109 Content-Type: text/plain; charset=ISO-8859-1 Content-Transfer-Encoding: 8bit X-Trace: posting.google.com 1014048446 14488 127.0.0.1 (18 Feb 2002 16:07:26 GMT) X-Complaints-To: groups-abuse@google.com NNTP-Posting-Date: 18 Feb 2002 16:07:26 GMT Xref: sn-us sci.techniques.testing.nondestructive:5734 To: nde@coqui.ccf.swri.edu Subject: [NDE] Who can tell me where I can find the basic information Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: Hi, I am a new comer here. I was wondering who could tell me the basic principle of operating a femmto-second laser, the application of this kind of laser. Besides, I also want to know some basic things about the measurement of index of refraction. Thanks a lot in advance!! From nde-admin@coqui.ccf.swri.edu Thu Feb 21 15:50:16 2002 Path: sn-us!sn-xit-01!supernews.com!newsfeed.gamma.ru!Gamma.RU!isdnet!news.internetia.pl!newsfeed.tpinternet.pl!news.tpi.pl!not-for-mail From: "Micha³ Radczuk" Newsgroups: sci.techniques.testing.nondestructive Date: Thu, 21 Feb 2002 19:06:03 +0100 Organization: tp.internet - http://www.tpi.pl/ Lines: 12 Message-ID: NNTP-Posting-Host: pb99.bydgoszcz.cvx.ppp.tpnet.pl X-Trace: news.tpi.pl 1014327850 7010 213.76.49.99 (21 Feb 2002 21:44:10 GMT) X-Complaints-To: usenet@tpi.pl NNTP-Posting-Date: Thu, 21 Feb 2002 21:44:10 +0000 (UTC) X-Newsreader: Microsoft Outlook Express 5.00.2417.2000 X-MSMail-Priority: Normal X-Priority: 3 X-MimeOLE: Produced By Microsoft MimeOLE V5.00.2314.1300 Xref: sn-us sci.techniques.testing.nondestructive:5735 To: nde@coqui.ccf.swri.edu Subject: [NDE] X-ray in NDT Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: X-rays are of great importance in NDT, and they have a lot of applications. But it is big problem in detection them. Photo film is still the best and it is impossible to build good electronic probe. I wonder why, and what is the idea of semiconductor X-ray detector. Thank You for help. Gostek From nde-admin@coqui.ccf.swri.edu Thu Feb 21 18:20:19 2002 Path: sn-us!sn-xit-06!supernews.com!paradoxa.ogoense.net!lnsnews.lns.cornell.edu!newsfeed.stanford.edu!newsfeeder.randori.com!news.randori.com!a7583771!not-for-mail Message-ID: <3C758CBB.C8FAECC3@cnde.iastate.edu> From: Sam Wormley Reply-To: swormley@cnde.iastate.edu X-Mailer: Mozilla 4.78 [en] (X11; U; Linux 2.4.17 i686) X-Accept-Language: en MIME-Version: 1.0 Newsgroups: sci.techniques.testing.nondestructive References: Content-Type: text/plain; charset=iso-8859-1 Content-Transfer-Encoding: 8bit Lines: 13 X-Complaints-To: abuse@randori.com - Please include ALL headers, thanks. Organization: Randori News - http://www.randori.com Date: Fri, 22 Feb 2002 00:11:41 GMT Xref: sn-us sci.techniques.testing.nondestructive:5736 To: nde@coqui.ccf.swri.edu Subject: [NDE] Re: X-ray in NDT Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: "Micha³ Radczuk" wrote: > > X-rays are of great importance in NDT, and they have a lot of > applications. But it is big problem in detection them. Photo film is still > the best and it is impossible to build good electronic probe. I wonder why, > and what is the idea of semiconductor X-ray detector. > > Thank You for help. > > Gostek Check detectors in these pages: http://www.cnde.iastate.edu/ncce/RT_CC/Intro_Adv.html From nde-admin@coqui.ccf.swri.edu Sat Feb 23 17:40:10 2002 Path: sn-us!sn-xit-01!supernews.com!newsfeed.stanford.edu!logbridge.uoregon.edu!pln-w!extra.newsguy.com!lotsanews.com!peernews.mcc.ac.uk!news.mcc.ac.uk!not-for-mail From: "Joe Kelleher" Newsgroups: sci.materials,sci.techniques.testing.nondestructive Date: Sat, 23 Feb 2002 23:37:38 -0000 Organization: University of Manchester Lines: 54 Message-ID: Reply-To: "Joe Kelleher" NNTP-Posting-Host: opg174.halls.umist.ac.uk X-Trace: godfrey.mcc.ac.uk 1014507439 67420 130.88.172.174 (23 Feb 2002 23:37:19 GMT) X-Complaints-To: usenet@godfrey.mcc.ac.uk NNTP-Posting-Date: 23 Feb 2002 23:37:19 GMT X-Priority: 3 X-MSMail-Priority: Normal X-Newsreader: Microsoft Outlook Express 5.50.4133.2400 X-MimeOLE: Produced By Microsoft MimeOLE V5.50.4133.2400 Xref: sn-us sci.materials:46075 sci.techniques.testing.nondestructive:5737 To: nde@coqui.ccf.swri.edu Subject: [NDE] Surface preparation of plain carbon steel for X-ray residual stress measurement Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: I need to prepare the surface of the cross-sections of some steel railway rails for residual stress measurement using X-ray diffraction. I'm assuming that the normal cutting/grinding procedures will give me a surface with a residually stressed layer around 100 microns deep. I need to remove this layer, in order to leave a surface with residual stresses that are close to the residual stresses in the rail before it was cut. I therefore need a material removal process that will firstly, not introduce residual stress in the material that remains, and secondly, not leave a rough surface as this relaxes the residual stresses in the surface that I'm trying to measure. The usual choice is electropolishing. The size of the sample means that I cannot use normal automatic electrolytic polishing machines that accept metallographic mounts. What I can do is immerse the whole rail in about a litre of solution, and use a power supply connected to a metal spatula with tissue on the end to treat small areas at a time. Various safety considerations rule out the use of perchloric acid in these circumstances, I think, but a solution of ammonium chloride in water and glycerol was recommended to me. I'm unsure as to the importance of temperature and current density, however. I'd like to set up the rail pieces so that the entirety of the surface was polished at the same time, to ensure an even surface, but as the area is large and the total current is limited by the power supply, the current density would be small. Does a lower-than-usual current density simply result in a slower polish (I could leave it overnight if necessary), or can it mess up the whole process? What I've been doing so far is etching the rails in a solution of picric acid in methanol. I chose picric acid so as not to preferentially attack grain boundaries, which might relieve stress in the surface if the attack went too far. Material does get removed from the surface, but the surface is uneven, possibly because the ferrite is being attacked faster than the pearlite, leaving a microscopic sponge-type structure on the surface. Further evidence for this theory is that when I subsequently attempted to electropolish a picric-acid-etched rail with the ammonium chloride solution, picric acid was evolved into the solution despite the rail being well cleaned. I was left with a rough surface, showing needle-like structures anywhere up to about 8 mm in length. I eventually opted to polish the rough surface using *only* a 1 micron diamond metallographic polishing wheel, to minimise the depth of the stress imparted. This takes several hours for each rail. Naturally I want to find a better process - the picric acid is slow (>24 hours) and messy, and the diamond polishing is tedious and uses unusually large quantities of polishing paste. I'd like to use an electropolish (or any other method) that gives a surface as smooth and as flat as the diamond polishing, without the effort. Any advice would be gratefully received. Joe Kelleher University of Manchester, UK jfk (at) bitsmart (dot) com From nde-admin@coqui.ccf.swri.edu Sat Feb 23 19:05:03 2002 Path: sn-us!sn-post-01!supernews.com!corp.supernews.com!not-for-mail From: "Big D" Newsgroups: sci.techniques.testing.nondestructive Date: Sat, 23 Feb 2002 15:44:12 -0500 Organization: Posted via Supernews, http://www.supernews.com Message-ID: X-Priority: 3 X-MSMail-Priority: Normal X-Newsreader: Microsoft Outlook Express 5.50.4133.2400 X-MimeOLE: Produced By Microsoft MimeOLE V5.50.4133.2400 X-Complaints-To: newsabuse@supernews.com Lines: 5 Xref: sn-us sci.techniques.testing.nondestructive:5738 To: nde@coqui.ccf.swri.edu Subject: [NDE] Level II Opening Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: I have one position to fill. Looking for Level II in RT, MT, UT, PT Florida location. Send resume to 321-861-6916. ASNT members will get first preference. From nde-admin@coqui.ccf.swri.edu Sat Feb 23 19:40:08 2002 Path: sn-us!sn-xit-03!supernews.com!nntp.cs.ubc.ca!logbridge.uoregon.edu!pln-e!spln!dex!extra.newsguy.com!newsp.newsguy.com!enews1 From: jbuch Newsgroups: sci.materials,sci.techniques.testing.nondestructive Date: Sat, 23 Feb 2002 19:06:14 -0600 Organization: NB Research Lines: 90 Message-ID: <3C783C86.16337F35@revealed.net> References: NNTP-Posting-Host: p-947.newsdawg.com Mime-Version: 1.0 Content-Type: text/plain; charset=us-ascii Content-Transfer-Encoding: 7bit X-Mailer: Mozilla 4.76 [en]C-PBI-NC404 (Win95; U) X-Accept-Language: en Xref: sn-us sci.materials:46076 sci.techniques.testing.nondestructive:5739 To: nde@coqui.ccf.swri.edu Subject: [NDE] Re: Surface preparation of plain carbon steel for X-ray residual stress measurement Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: Joe Kelleher wrote: > > I need to prepare the surface of the cross-sections of some steel railway > rails for residual stress measurement using X-ray diffraction. I'm assuming > that the normal cutting/grinding procedures will give me a surface with a > residually stressed layer around 100 microns deep. I need to remove this > layer, in order to leave a surface with residual stresses that are close to > the residual stresses in the rail before it was cut. I therefore need a > material removal process that will firstly, not introduce residual stress in > the material that remains, and secondly, not leave a rough surface as this > relaxes the residual stresses in the surface that I'm trying to measure. > > The usual choice is electropolishing. The size of the sample means that I > cannot use normal automatic electrolytic polishing machines that accept > metallographic mounts. What I can do is immerse the whole rail in about a > litre of solution, and use a power supply connected to a metal spatula with > tissue on the end to treat small areas at a time. Various safety > considerations rule out the use of perchloric acid in these circumstances, I > think, but a solution of ammonium chloride in water and glycerol was > recommended to me. I'm unsure as to the importance of temperature and > current density, however. I'd like to set up the rail pieces so that the > entirety of the surface was polished at the same time, to ensure an even > surface, but as the area is large and the total current is limited by the > power supply, the current density would be small. Does a lower-than-usual > current density simply result in a slower polish (I could leave it overnight > if necessary), or can it mess up the whole process? > > What I've been doing so far is etching the rails in a solution of picric > acid in methanol. I chose picric acid so as not to preferentially attack > grain boundaries, which might relieve stress in the surface if the attack > went too far. Material does get removed from the surface, but the surface is > uneven, possibly because the ferrite is being attacked faster than the > pearlite, leaving a microscopic sponge-type structure on the surface. > Further evidence for this theory is that when I subsequently attempted to > electropolish a picric-acid-etched rail with the ammonium chloride solution, > picric acid was evolved into the solution despite the rail being well > cleaned. I was left with a rough surface, showing needle-like structures > anywhere up to about 8 mm in length. I eventually opted to polish the rough > surface using *only* a 1 micron diamond metallographic polishing wheel, to > minimise the depth of the stress imparted. This takes several hours for each > rail. > > Naturally I want to find a better process - the picric acid is slow (>24 > hours) and messy, and the diamond polishing is tedious and uses unusually > large quantities of polishing paste. I'd like to use an electropolish (or > any other method) that gives a surface as smooth and as flat as the diamond > polishing, without the effort. > > Any advice would be gratefully received. > > Joe Kelleher > University of Manchester, UK > jfk (at) bitsmart (dot) com Imagine cutting from running surface to root surface so as to make a long thin wedge. The cut surface passes through or locally exposes almost every possible local area for residual stress determination. It may hypothetically be impractically long, but that isn't important to understand the actual way you would utilize oblique sectioning. Now, you electropolish this surface to a depth that eliminates the machine induced residual stress. You establish this by the same xray technique on a dummy bar, or a portion of the rail or a different rail that were loaded low enough that you think that the residual stress is sorta constant. Think about it some more, the particular tricks to be used in your case will come to you. This has then given you a long specimen with a surface that represents true residual stress and you could imagine simply stepping this monster specimen through an experimental apparatus. This might be cut into smaller lengths for handling purposes. Be sure you spell the name right in the credits.... Jim -- ----------------------------------------------- A keepsake quality gift for young girls, A personalized adventure book: http://www.youralicebook.com FREE__ Screensavers and Software to stretch the budget this Christmas. http://www.YourAliceBook.com/WhatsHere/FreeSoftware.htm From nde-admin@coqui.ccf.swri.edu Sun Feb 24 07:00:07 2002 Path: sn-us!sn-xit-04!supernews.com!216.227.56.88.MISMATCH!DirecTVinternet!DirecTV-DSL!news-spur1.maxwell.syr.edu!news.maxwell.syr.edu!lon1-news.nildram.net!peernews!peer.cwci.net!news5-gui.server.ntli.net!ntli.net!news6-win.server.ntlworld.com.POSTED!not-for-mail From: "D Deuchar" Newsgroups: sci.materials,sci.techniques.testing.nondestructive References: Lines: 79 X-Priority: 3 X-MSMail-Priority: Normal X-Newsreader: Microsoft Outlook Express 6.00.2600.0000 X-MimeOLE: Produced By Microsoft MimeOLE V6.00.2600.0000 Message-ID: Date: Sun, 24 Feb 2002 12:53:04 -0000 NNTP-Posting-Host: 62.254.89.43 X-Complaints-To: abuse@ntlworld.com X-Trace: news6-win.server.ntlworld.com 1014555186 62.254.89.43 (Sun, 24 Feb 2002 12:53:06 GMT) NNTP-Posting-Date: Sun, 24 Feb 2002 12:53:06 GMT Organization: ntl Cablemodem News Service Xref: sn-us sci.materials:46082 sci.techniques.testing.nondestructive:5740 To: nde@coqui.ccf.swri.edu Subject: [NDE] Re: Surface preparation of plain carbon steel for X-ray residual stress measurement Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: Considering the mechanical polishing process. Surely if the stock removal at each stage of mechanical sample preparation is sufficient then a surface finish polished with 1 micron diamond will have the same residual stress pattern as one prepared using only 1 micron diamond. I have seen figures for the required stock removal, but dont have them to hand, the figure of three times the amount of polishing required to remove the scratches comes to mind. "Joe Kelleher" wrote in message news:a5993f$21qs$1@godfrey.mcc.ac.uk... > I need to prepare the surface of the cross-sections of some steel railway > rails for residual stress measurement using X-ray diffraction. I'm assuming > that the normal cutting/grinding procedures will give me a surface with a > residually stressed layer around 100 microns deep. I need to remove this > layer, in order to leave a surface with residual stresses that are close to > the residual stresses in the rail before it was cut. I therefore need a > material removal process that will firstly, not introduce residual stress in > the material that remains, and secondly, not leave a rough surface as this > relaxes the residual stresses in the surface that I'm trying to measure. > > The usual choice is electropolishing. The size of the sample means that I > cannot use normal automatic electrolytic polishing machines that accept > metallographic mounts. What I can do is immerse the whole rail in about a > litre of solution, and use a power supply connected to a metal spatula with > tissue on the end to treat small areas at a time. Various safety > considerations rule out the use of perchloric acid in these circumstances, I > think, but a solution of ammonium chloride in water and glycerol was > recommended to me. I'm unsure as to the importance of temperature and > current density, however. I'd like to set up the rail pieces so that the > entirety of the surface was polished at the same time, to ensure an even > surface, but as the area is large and the total current is limited by the > power supply, the current density would be small. Does a lower-than-usual > current density simply result in a slower polish (I could leave it overnight > if necessary), or can it mess up the whole process? > > What I've been doing so far is etching the rails in a solution of picric > acid in methanol. I chose picric acid so as not to preferentially attack > grain boundaries, which might relieve stress in the surface if the attack > went too far. Material does get removed from the surface, but the surface is > uneven, possibly because the ferrite is being attacked faster than the > pearlite, leaving a microscopic sponge-type structure on the surface. > Further evidence for this theory is that when I subsequently attempted to > electropolish a picric-acid-etched rail with the ammonium chloride solution, > picric acid was evolved into the solution despite the rail being well > cleaned. I was left with a rough surface, showing needle-like structures > anywhere up to about 8 mm in length. I eventually opted to polish the rough > surface using *only* a 1 micron diamond metallographic polishing wheel, to > minimise the depth of the stress imparted. This takes several hours for each > rail. > > Naturally I want to find a better process - the picric acid is slow (>24 > hours) and messy, and the diamond polishing is tedious and uses unusually > large quantities of polishing paste. I'd like to use an electropolish (or > any other method) that gives a surface as smooth and as flat as the diamond > polishing, without the effort. > > Any advice would be gratefully received. > > > Joe Kelleher > University of Manchester, UK > jfk (at) bitsmart (dot) com > > From nde-admin@coqui.ccf.swri.edu Sun Feb 24 08:30:05 2002 Path: sn-us!sn-xit-06!supernews.com!router1.news.adelphia.net!news-spur1.maxwell.syr.edu!news.maxwell.syr.edu!btnet-peer1!btnet-peer0!btnet-peer!btnet!news-hub.cableinet.net!blueyonder!peer.news.eu-x.com!server2.netnews.ja.net!mimas.salford.ac.uk!peernews.mcc.ac.uk!news.mcc.ac.uk!not-for-mail From: "Joe Kelleher" Newsgroups: sci.materials,sci.techniques.testing.nondestructive Date: Sun, 24 Feb 2002 14:24:46 -0000 Organization: University of Manchester Lines: 50 Message-ID: References: Reply-To: "Joe Kelleher" NNTP-Posting-Host: opg174.halls.umist.ac.uk X-Trace: godfrey.mcc.ac.uk 1014560663 16627 130.88.172.174 (24 Feb 2002 14:24:23 GMT) X-Complaints-To: usenet@godfrey.mcc.ac.uk NNTP-Posting-Date: 24 Feb 2002 14:24:23 GMT X-Priority: 3 X-MSMail-Priority: Normal X-Newsreader: Microsoft Outlook Express 5.50.4133.2400 X-MIMEOLE: Produced By Microsoft MimeOLE V5.50.4133.2400 Xref: sn-us sci.materials:46084 sci.techniques.testing.nondestructive:5741 To: nde@coqui.ccf.swri.edu Subject: [NDE] Re: Surface preparation of plain carbon steel for X-ray residual stress measurement Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: "D Deuchar" wrote in message news:Sm5e8.28755$hM6.3758553@news6-win.server.ntlworld.com... > [Removal of residual stress layer by polishing] > Considering the mechanical polishing process. Surely if the stock removal at > each stage of mechanical sample preparation is sufficient then a surface > finish polished with 1 micron diamond will have the same residual stress > pattern as one prepared using only 1 micron diamond. > I have seen figures for the required stock removal, but dont have them to > hand, the figure of three times the amount of polishing required to remove > the scratches comes to mind. I've looked for figures concerning this, but the only data I can find is for coarser (e.g. 220 and 400 grit) grinding, and it's not always stated that this is for wet metallographic grinding. One paper also mentions the grinding speed and pressure applied also make a difference to the induced residual stress. I can't find any data for fine grit grinding or diamond polishing, so I don't even know to what depth the 1 micron polishing is introducing stress. I'm assuming anywhere up to about 4 microns, so with an X-ray penetration depth of 20 microns, I'm expecting to see an asymmetric peak that is broader on the compressive side. I've yet to make my first X-ray measurement, however. I have two concerns with using coarser grinding before the final preparation. Firstly, if I remove slightly too little material at a coarse stage, I'll naturally be left with a residual stress layer that finer stages will not be able to remove. Unlike scratches, though, residual stresses are of course invisible, so I'll never know! Even when I take the X-ray stress measurements, I've no way of knowing if the stresses I'm seeing are those that I'm looking for, or those I put there myself. My second worry is that even if I do know how much material to remove, judging the amount that is removed can be tricky. Micrometer measurements would need to be taken at many points on the surface. I also thought of putting a Vickers indentation in the surface, calculating the depth from the width, and watching for when it disappeared - but one of our technicians told me that the edges of the indent get worn first, and make it hard to see before it really disappears. Nonetheless, I'd be very interested to see data (or just a reference) relating to the residual stress depth profiles introduced by mechanical grinding and polishing procedures. If I find I can safely use a coarser grinding first, it would speed up the process considerably. Joe Kelleher University of Manchester, UK jfk (at) bitsmart (dot) com From nde-admin@coqui.ccf.swri.edu Sun Feb 24 10:25:12 2002 Path: sn-us!sn-xit-06!supernews.com!priapus.visi.com!news-out.visi.com!hermes.visi.com!news.tele.dk!small.news.tele.dk!193.174.75.178!news-fra1.dfn.de!fu-berlin.de!server1.netnews.ja.net!peernews.mcc.ac.uk!news.mcc.ac.uk!not-for-mail From: "Joe Kelleher" Newsgroups: sci.materials,sci.techniques.testing.nondestructive Date: Sun, 24 Feb 2002 16:19:01 -0000 Organization: University of Manchester Lines: 43 Message-ID: References: <3C783C86.16337F35@revealed.net> Reply-To: "Joe Kelleher" NNTP-Posting-Host: opg174.halls.umist.ac.uk X-Trace: godfrey.mcc.ac.uk 1014567518 25608 130.88.172.174 (24 Feb 2002 16:18:38 GMT) X-Complaints-To: usenet@godfrey.mcc.ac.uk NNTP-Posting-Date: 24 Feb 2002 16:18:38 GMT X-Priority: 3 X-MSMail-Priority: Normal X-Newsreader: Microsoft Outlook Express 5.50.4133.2400 X-MIMEOLE: Produced By Microsoft MimeOLE V5.50.4133.2400 Xref: sn-us sci.materials:46085 sci.techniques.testing.nondestructive:5742 To: nde@coqui.ccf.swri.edu Subject: [NDE] Re: Surface preparation of plain carbon steel for X-ray residual stress measurement Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: "jbuch" wrote > Imagine cutting from running surface to root surface so as to make a > long thin wedge. > > The cut surface passes through or locally exposes almost every possible > local area for residual stress determination. It may hypothetically be > impractically long, but that isn't important to understand the actual > way you would utilize oblique sectioning. > > Now, you electropolish this surface to a depth that eliminates the > machine induced residual stress. You establish this by the same xray > technique on a dummy bar, or a portion of the rail or a different rail > that were loaded low enough that you think that the residual stress is > sorta constant. Think about it some more, the particular tricks to be > used in your case will come to you. I'm aware of a few methods related to oblique sectioning that have been used in rails. One involves taking a vertical cross section and another one at 30 degrees to the vertical. By then dicing the vertical one its possible to work out the vertical and transverse (i.e. parallel to the train axle) stresses. An algorithm was proposed to calculate the longitudinal (parallel to train running direction) stresses by comparing the results of dicing the vertical slice and dicing the oblique slice. I'm expecting to have to do something similar at some point. Rather than using dicing, I'll be using X-ray stress measurement, and AEA Technology's MAPS system, which uses a magnetic probe to measure the biaxial stress field at a small depth into a surface. By doing such measurements on surfaces inclined at different angles, I'm hoping to deduce the full 3D stress tensor at different points in the material. Ideally I'd be able to take into account all the relaxation that occurs when cutting to expose the necessary surfaces in the first place. I'm also reluctant to depend completely on the assumption that the stress field does not vary along the length of the rail, although this assumption is the basis of many stress measurement methods that have been used with rails. Joe Kelleher University of Manchester, UK jfk (at) bitsmart (dot) com From nde-admin@coqui.ccf.swri.edu Sun Feb 24 10:35:03 2002 Path: sn-us!sn-xit-03!supernews.com!logbridge.uoregon.edu!canoe.uoregon.edu!nntp4.savvis.net!feed.news.sonic.net!typhoon.sonic.net!not-for-mail Message-ID: <3C7914D2.FC7CB49E@sonic.net> From: Mark Thorson X-Mailer: Mozilla 4.6 [en] (WinNT; I) X-Accept-Language: en MIME-Version: 1.0 Newsgroups: sci.materials,sci.techniques.testing.nondestructive References: Content-Type: text/plain; charset=us-ascii Content-Transfer-Encoding: 7bit Lines: 12 Date: Sun, 24 Feb 2002 16:27:55 GMT NNTP-Posting-Host: 209.204.154.247 X-Complaints-To: abuse@sonic.net X-Trace: typhoon.sonic.net 1014568075 209.204.154.247 (Sun, 24 Feb 2002 08:27:55 PST) NNTP-Posting-Date: Sun, 24 Feb 2002 08:27:55 PST Xref: sn-us sci.materials:46086 sci.techniques.testing.nondestructive:5743 To: nde@coqui.ccf.swri.edu Subject: [NDE] Re: Surface preparation of plain carbon steel for X-ray residual stress measurement Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: Joe Kelleher wrote: > Naturally I want to find a better process - the picric acid is slow (>24 > hours) and messy, and the diamond polishing is tedious and uses unusually > large quantities of polishing paste. I'd like to use an electropolish (or > any other method) that gives a surface as smooth and as flat as the diamond > polishing, without the effort. Would EDM be useful here? It would impart no residual stress, right? From nde-admin@coqui.ccf.swri.edu Sun Feb 24 11:45:06 2002 Path: sn-us!sn-xit-06!supernews.com!router1.news.adelphia.net!news-spur1.maxwell.syr.edu!news.maxwell.syr.edu!news.he.net!cyclone-sf.pbi.net!165.113.238.17!pln-w!spln!dex!extra.newsguy.com!newsp.newsguy.com!enews3 From: jbuch Newsgroups: sci.materials,sci.techniques.testing.nondestructive Date: Sun, 24 Feb 2002 11:17:08 -0600 Organization: NB Research Lines: 67 Message-ID: <3C792014.1B2124EA@revealed.net> References: <3C783C86.16337F35@revealed.net> NNTP-Posting-Host: p-470.newsdawg.com Mime-Version: 1.0 Content-Type: text/plain; charset=us-ascii Content-Transfer-Encoding: 7bit X-Mailer: Mozilla 4.76 [en]C-PBI-NC404 (Win95; U) X-Accept-Language: en Xref: sn-us sci.materials:46088 sci.techniques.testing.nondestructive:5744 To: nde@coqui.ccf.swri.edu Subject: [NDE] Re: Surface preparation of plain carbon steel for X-ray residual stress measurement Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: Joe Kelleher wrote: > > "jbuch" wrote > > > Imagine cutting from running surface to root surface so as to make a > > long thin wedge. > > I'm expecting to have to do something similar at some point. Rather than > using dicing, I'll be using X-ray stress measurement, and AEA Technology's > MAPS system, which uses a magnetic probe to measure the biaxial stress field > at a small depth into a surface. By doing such measurements on surfaces > inclined at different angles, I'm hoping to deduce the full 3D stress tensor > at different points in the material. Ideally I'd be able to take into > account all the relaxation that occurs when cutting to expose the necessary > surfaces in the first place. I'm also reluctant to depend completely on the > assumption that the stress field does not vary along the length of the rail, > although this assumption is the basis of many stress measurement methods > that have been used with rails. > > Joe Kelleher > University of Manchester, UK > jfk (at) bitsmart (dot) com If the residual stress distribution doe indeed vary along the rail, then what is the point of trying to determine it? Actually, the location of the track and the degree of ballast and rail support could be critical in that the location from which the rail was extracted could be a habitual "hump". In my local rail network, such things can be seen if you watch carefully as a long unit train passes through. There is a point at which one has too great of a set of expectations, and they ruin the applicability of the results. USC ran a project using JPL facilities many years ago on dental implants. They did finite element modeling of the single tooth and the entire mandible - jawbone, in full 3D. Then, they wanted to test the analysis so they strain-gaged the system. They located the gages often at the locations of highest stress. These turned out to also be the locations of highest stress gradient... as is typical in stress concentration situations. Therefore the results were the least accurate because of the uncertainties in exact location of finite sized gages on a highly varying stress field. Did you get any solid information on the location of the rail and local dynamics? Or is this mainly to explore and test out a new data acquisition technique? Dissertation? Jim -- ----------------------------------------------- A keepsake quality gift for young girls, A personalized adventure book: http://www.youralicebook.com FREE__ Screensavers and Software to stretch the budget. http://www.YourAliceBook.com/WhatsHere/FreeSoftware.htm From nde-admin@coqui.ccf.swri.edu Sun Feb 24 14:25:06 2002 Path: sn-us!sn-xit-06!supernews.com!router1.news.adelphia.net!logbridge.uoregon.edu!newsfeed.cwix.com!wn2feed!worldnet.att.net!209.155.233.17!pln-w!extra.newsguy.com!lotsanews.com!peernews.mcc.ac.uk!news.mcc.ac.uk!not-for-mail From: "Joe Kelleher" Newsgroups: sci.materials,sci.techniques.testing.nondestructive Date: Sun, 24 Feb 2002 20:22:31 -0000 Organization: University of Manchester Lines: 89 Message-ID: References: <3C783C86.16337F35@revealed.net> <3C792014.1B2124EA@revealed.net> Reply-To: "Joe Kelleher" NNTP-Posting-Host: opg174.halls.umist.ac.uk X-Trace: godfrey.mcc.ac.uk 1014582128 34509 130.88.172.174 (24 Feb 2002 20:22:08 GMT) X-Complaints-To: usenet@godfrey.mcc.ac.uk NNTP-Posting-Date: 24 Feb 2002 20:22:08 GMT X-Priority: 3 X-MSMail-Priority: Normal X-Newsreader: Microsoft Outlook Express 5.50.4133.2400 X-MimeOLE: Produced By Microsoft MimeOLE V5.50.4133.2400 Xref: sn-us sci.materials:46091 sci.techniques.testing.nondestructive:5745 To: nde@coqui.ccf.swri.edu Subject: [NDE] Re: Surface preparation of plain carbon steel for X-ray residual stress measurement Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: "jbuch" wrote > If the residual stress distribution doe indeed vary along the rail, then > what is the point of trying to determine it? It's quite possible that the stress distribution pattern varies along a short length, but that pattern gets repeated along the length. This could be the result of a deformed roller in the manufacturing process, for example. Even if the distribution is non-repeating, it would be useful to know maximum and minimum stresses along along the length, at a fixed height and lateral position. I've no particular reason to think that the stress does vary along the length, but I've seen results from many sources that use methods that make the assumption that it remains constant along the length. If I could make some measurements that tested the stress at different longitudinal positions, I'd be able to test the validity of this assumption. > Actually, the location of the track and the degree of ballast and rail > support could be critical in that the location from which the rail was > extracted could be a habitual "hump". In my local rail network, such > things can be seen if you watch carefully as a long unit train passes > through. Some finite element work I read a while back (by Jonas Ringsberg if I remember correctly) suggested the effect of e.g. the position between sleepers and quality of ballast was less important than the track curvature and typical train speed etc. But of course, such models don't account for any specific localised defects, like humps, cracked sleepers, subsidence etc.. I've just got to hope that the samples I work on came from 'normal' stretches of rail, where any defects are typical of used rail and subtle enough not to be visible to a person looking at the rail when a train passes. > There is a point at which one has too great of a set of expectations, > and they ruin the applicability of the results. > > USC ran a project using JPL facilities many years ago on dental > implants. They did finite element modeling of the single tooth and the > entire mandible - jawbone, in full 3D. > > Then, they wanted to test the analysis so they strain-gaged the system. > > They located the gages often at the locations of highest stress. These > turned out to also be the locations of highest stress gradient... as is > typical in stress concentration situations. Therefore the results were > the least accurate because of the uncertainties in exact location of > finite sized gages on a highly varying stress field. A good example. > Did you get any solid information on the location of the rail and local > dynamics? > > Or is this mainly to explore and test out a new data acquisition > technique? Dissertation? It's for a PhD. At the moment I'm working on specimens that were left from a previous project, some of which have been measured with synchrotron x-rays (at ESRF). In the next month or so, I'm expecting some more lengths of rail, one roller straightened but unused, and about four ex-service rails with various different service times. The sponsors of the PhD (Corus) want me to find a correlation between service time and residual stress, but they also tell me the usage history will be different for all rails and the total load seen by each rail won't be proportional to their age. Thus, I'm expecting I'll have more luck correlating the amount of wear, which I can measure as I know the original shape, to the residual stress distribution. Personally I'm also interested in the measurement techniques and data processing methods that are applied to the data. At the moment, this means X-ray and magnetic measurements of stress. Some people in my department want me to use Michael B. Prime's EDM-cut-it-and-look-at-the-surface-profile residual stress measurement method, to give me the longitudinal stresses, which I'd like to try because getting the longitudinal stress is usually more difficult with most other methods. I'm also curious about methods which monitor deformation (using moire interferometry, speckle pattern, image correlation or whatever) caused by stress relief resulting from thermal annealing. I've seen only one paper that reports the use of this method, coincidentally also on rails (YY Wang, XF Shen & FP Chiang, Wear 1996, 191(1-2) p. 90-94). Joe Kelleher University of Manchester, UK jfk (at) bitsmart (dot) com From nde-owner Sun Feb 24 18:40:18 2002 Received: from viruswall.ccf.swri.edu (localhost [127.0.0.1]) by coqui.ccf.swri.edu (8.11.2/8.11.2) with ESMTP id g1P0eHm11872 for ; Sun, 24 Feb 2002 18:40:18 -0600 (CST) Received: from mailhub.ccf.swri.edu (localhost [127.0.0.1]) by viruswall.ccf.swri.edu (8.10.2+Sun/8.10.2) with ESMTP id g1P0eGm01509 for ; Sun, 24 Feb 2002 18:40:16 -0600 (CST) Received: from smail-103.hanmail.net (smail-103.hanmail.net [211.233.29.58]) by mailhub.ccf.swri.edu (8.11.2/8.11.2) with ESMTP id g1P0eFT01574 for ; Sun, 24 Feb 2002 18:40:15 -0600 (CST) Received: from www5.hanmail.net (www5.hanmail.net [211.32.117.25]) by smail-103.hanmail.net (8.10.0/8.9.1) with ESMTP id g1P0eBA22606; Mon, 25 Feb 2002 09:40:11 +0900 Received: (from hanadmin@localhost) by www5.hanmail.net (8.10.0/8.9.1) id g1P0dtP11185 for ; Mon, 25 Feb 2002 09:39:55 +0900 (KST) X-Originating-IP: [210.115.231.116] From: "Kyungran Pak" Reply-To: "Kyungran Pak" Organization: =?EUC-KR?B?x9G4srTrx9Cxsw==?= To: X-Mailer: Daum Web Mailer 1.0 Date: Mon, 25 Feb 2002 09:39:54 +0900 (KST) Message-Id: <20020225093954.HM.40000000003LgFS@www5.hanmail.net> MIME-Version: 1.0 Content-Type: text/plain; charset=euc-kr Content-Transfer-Encoding: 8bit Subject: [NDE] Hello Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: Hi, My name is Pak. I am a Postdoctor working at the University for the corrosion project. I am forwarding this message to you by the recommendation of Joseph Yosi I am working on the microbial corrosion with iron coupon. I have several ways to detect corrosion but seemed not working well. Weight loss, SEM, liquid penetration and magnetic particles...However, I cant't find the developer for liquid penetration. Therefore, I'd like to ask you a favor to inform me the procedure of the liquid penetration, if you can. For your information, the size of iron coupon is about 1cmX3.8cm I appreciate your help in advance. Take care!! ============================================================================== ¿ì¸® ÀÎÅͳÝ, Daum http://www.daum.net - Daumȸ¿øÀ» À§ÇÑ ÀÎÅͳݼîÇÎ + ÆÄ¿ö °øµ¿±¸¸Å ¢Ñ http://hmm.daum.net/shop_0202 - 100% ¸ÂÃã ±¤°í! Daum°Ë»ö Å°¿öµå¼¥ ¢Ñ http://hmm.daum.net/keyword_top_0202 From nde-admin@coqui.ccf.swri.edu Sun Feb 24 18:55:03 2002 Path: sn-us!sn-xit-06!supernews.com!router1.news.adelphia.net!logbridge.uoregon.edu!pln-e!spln!dex!extra.newsguy.com!newsp.newsguy.com!enews4 From: jbuch Newsgroups: sci.materials,sci.techniques.testing.nondestructive Date: Sun, 24 Feb 2002 18:21:43 -0600 Organization: NB Research Lines: 85 Message-ID: <3C798397.EAECAC5A@revealed.net> References: <3C783C86.16337F35@revealed.net> <3C792014.1B2124EA@revealed.net> NNTP-Posting-Host: p-110.newsdawg.com Mime-Version: 1.0 Content-Type: text/plain; charset=us-ascii Content-Transfer-Encoding: 7bit X-Mailer: Mozilla 4.76 [en]C-PBI-NC404 (Win95; U) X-Accept-Language: en Xref: sn-us sci.materials:46093 sci.techniques.testing.nondestructive:5746 To: nde@coqui.ccf.swri.edu Subject: [NDE] Re: Surface preparation of plain carbon steel for X-ray residual stress measurement Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: Joe Kelleher wrote: > > "jbuch" wrote > > > Some finite element work I read a while back (by Jonas Ringsberg if I > remember correctly) suggested the effect of e.g. the position between > sleepers and quality of ballast was less important than the track curvature > and typical train speed etc. But of course, such models don't account for > any specific localised defects, like humps, cracked sleepers, subsidence > etc.. I've just got to hope that the samples I work on came from 'normal' > stretches of rail, where any defects are typical of used rail and subtle > enough not to be visible to a person looking at the rail when a train > passes. > I can really see the tearing up of the curvature in my local track. It is urban, along the Mississippi river and they run a really large number of heavily loaded trains through, only a few of which are the equivalent of Unit trains. The wear on these low speed gentle heavily loaded turns is enormous... This is some of the most beat up track I have seen in my life. The joints are often fatigue fractured... like at the rail ends at the joint, it had cracked and fractured out a sort of chip. Well, the comment on major significance of curvature fits the visible signs I see. > It's for a PhD. At the moment I'm working on specimens that were left from a > previous project, some of which have been measured with synchrotron x-rays > (at ESRF). In the next month or so, I'm expecting some more lengths of rail, > one roller straightened but unused, and about four ex-service rails with > various different service times. > > The sponsors of the PhD (Corus) want me to find a correlation between > service time and residual stress, but they also tell me the usage history > will be different for all rails and the total load seen by each rail won't > be proportional to their age. Thus, I'm expecting I'll have more luck > correlating the amount of wear, which I can measure as I know the original > shape, to the residual stress distribution. > > Personally I'm also interested in the measurement techniques and data > processing methods that are applied to the data. At the moment, this means > X-ray and magnetic measurements of stress. Some people in my department want > me to use Michael B. Prime's EDM-cut-it-and-look-at-the-surface-profile > residual stress measurement method, to give me the longitudinal stresses, > which I'd like to try because getting the longitudinal stress is usually > more difficult with most other methods. I'm also curious about methods which > monitor deformation (using moire interferometry, speckle pattern, image > correlation or whatever) caused by stress relief resulting from thermal > annealing. I've seen only one paper that reports the use of this method, > coincidentally also on rails (YY Wang, XF Shen & FP Chiang, Wear 1996, > 191(1-2) p. 90-94). > > Joe Kelleher > University of Manchester, UK > jfk (at) bitsmart (dot) com I have long wanted to do residual stress work. For my PhD, I did "The Dislocation Analysis of Stress" in which I derived the dislocation distributions that would correspond to an arbitrary residual stress distribution. Tensor descriptions of all fields, of course. Hairy math, but I was young and impressed by math. I have long felt that we have a lot to learn from understanding the residual stress and the dislocations causing the effects. But mostly my attention used to be on simple loadings like a single bend or two, not the literally millions of heavy load cycles that in service rails get. Sometimes I think that a million wheels roll by in just a single day, but perhaps I exaggerate. Jim -- ----------------------------------------------- A keepsake quality gift for young girls, A personalized adventure book: http://www.youralicebook.com FREE__ Screensavers and Software to stretch the budget this Christmas. http://www.YourAliceBook.com/WhatsHere/FreeSoftware.htm From nde-admin@coqui.ccf.swri.edu Mon Feb 25 09:45:07 2002 Path: sn-us!sn-xit-06!supernews.com!paradoxa.ogoense.net!lnsnews.lns.cornell.edu!newsfeed.stanford.edu!canoe.uoregon.edu!news.uoregon.edu!not-for-mail From: Mike Prime Newsgroups: sci.materials,sci.techniques.testing.nondestructive Date: Mon, 25 Feb 2002 08:39:39 -0700 Organization: ESA division, Los Alamos National Laboratory Lines: 37 Message-ID: <3C7A5ABB.679F107F@lanl.gov> References: <3C783C86.16337F35@revealed.net> <3C792014.1B2124EA@revealed.net> <3C798397.EAECAC5A@revealed.net> NNTP-Posting-Host: hatchet.esa.lanl.gov Mime-Version: 1.0 Content-Type: text/plain; charset=us-ascii Content-Transfer-Encoding: 7bit X-Trace: pith.uoregon.edu 1014651643 21322 128.165.140.122 (25 Feb 2002 15:40:43 GMT) X-Complaints-To: news@news.uoregon.edu NNTP-Posting-Date: Mon, 25 Feb 2002 15:40:43 +0000 (UTC) X-Mailer: Mozilla 4.79 [en] (Windows NT 5.0; U) X-Accept-Language: en Xref: sn-us sci.materials:46096 sci.techniques.testing.nondestructive:5747 To: nde@coqui.ccf.swri.edu Subject: [NDE] Re: Surface preparation of plain carbon steel for X-ray residual stress measurement Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: > Joe Kelleher wrote: > > > > Personally I'm also interested in the measurement techniques and data > > processing methods that are applied to the data. At the moment, this means > > X-ray and magnetic measurements of stress. Some people in my department want > > me to use Michael B. Prime's EDM-cut-it-and-look-at-the-surface-profile > > residual stress measurement method, to give me the longitudinal stresses, > > which I'd like to try because getting the longitudinal stress is usually > > more difficult with most other methods. Of course, I think that's a great idea, but I'm hardly objective. Some info on this method at: http://www.lanl.gov/contour/ Two things to keep in mind: 1) The contour method can give a great map of the longitudinal residual stresses over the whole cross section EXCEPT right near surface because the assumption of a flat cut is not great right near the surface. If you need those, use x-ray around the perimeter before you cut it. 2) You could actually use the contour method to get all 3 stress components. The same FEM calculation that tells you the longitudinal stresses from the measured surface contour also tells you how the other stress components have changed. So if you subsequently measure the surface stresses using x-ray (you still have your electropolish problem to deal with), you can get the 3 components of normal stress. This is described briefly in the journal article on the contour method (preprint on web page, this is just A+B=C in Figure 1). I'm in the process of experimentally proving this multiple stress component capability, but it will take more than a year to get it published. For now, you'll have to take my word on it. As far the the electropolish, we've had some luck on big steel pieces using 70 vol % sulfuric, 3 wt % chromic acid at room temp. Best of luck. I'm glad to answer any more questions. Mike From nde-owner Mon Feb 25 17:11:01 2002 Received: from viruswall.ccf.swri.edu (localhost [127.0.0.1]) by coqui.ccf.swri.edu (8.11.2/8.11.2) with ESMTP id g1PNB1Y27490 for ; Mon, 25 Feb 2002 17:11:01 -0600 (CST) Received: from mailhub.ccf.swri.edu (localhost [127.0.0.1]) by viruswall.ccf.swri.edu (8.10.2+Sun/8.10.2) with ESMTP id g1PNB0m19866 for ; Mon, 25 Feb 2002 17:11:00 -0600 (CST) Received: from mta3.snfc21.pbi.net (mta3.snfc21.pbi.net [206.13.28.141]) by mailhub.ccf.swri.edu (8.11.2/8.11.2) with ESMTP id g1PNB0T27400 for ; Mon, 25 Feb 2002 17:11:00 -0600 (CST) Received: from [192.168.1.101] ([63.203.70.244]) by mta3.snfc21.pbi.net (Sun Internet Mail Server sims.3.5.2000.03.23.18.03.p10) with ESMTP id <0GS400GNM321F3@mta3.snfc21.pbi.net> for nde@coqui.ccf.swri.edu; Mon, 25 Feb 2002 15:10:50 -0800 (PST) Date: Mon, 25 Feb 2002 14:55:12 -0800 From: RAD X-Sender: rocky%xdcr.com@pop.xdcr.com To: nde@coqui.ccf.swri.edu Message-id: MIME-version: 1.0 Content-type: text/plain; charset="us-ascii" ; format="flowed" Subject: [NDE] Used Ultrasonic Equipment for Sale Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: I have the following ultrasonic equipment for sale on eBay. Panametrics 500PR pulser-receiver in nearly new condition. Tektronix 11402 Oscilloscope with two Plug-Ins. Can operate from DC to 1 GHz. Regards, Rocky From nde-owner Mon Feb 25 19:20:10 2002 Received: from viruswall.ccf.swri.edu (localhost [127.0.0.1]) by coqui.ccf.swri.edu (8.11.2/8.11.2) with ESMTP id g1Q1K9w10374 for ; Mon, 25 Feb 2002 19:20:09 -0600 (CST) Received: from mailhub.ccf.swri.edu (localhost [127.0.0.1]) by viruswall.ccf.swri.edu (8.10.2+Sun/8.10.2) with ESMTP id g1Q1K9m29139 for ; Mon, 25 Feb 2002 19:20:09 -0600 (CST) Received: from ms.cc.ntu.edu.tw (ms.cc.ntu.edu.tw [140.112.8.200]) by mailhub.ccf.swri.edu (8.11.2/8.11.2) with ESMTP id g1Q1K8T03399 for ; Mon, 25 Feb 2002 19:20:08 -0600 (CST) Received: from FLY12 (Fly12.me.ntu.edu.tw [140.112.14.176]) by ms.cc.ntu.edu.tw (8.11.0/8.11.0) with SMTP id g1Q1JUL19664 for ; Tue, 26 Feb 2002 09:19:30 +0800 (CST) Message-ID: <001c01c1be63$cf80d090$b00e708c@FLY12> From: =?big5?B?uK2nu7St?= To: Date: Tue, 26 Feb 2002 09:20:43 +0800 MIME-Version: 1.0 Content-Type: multipart/alternative; boundary="----=_NextPart_000_0019_01C1BEA6.DD903A70" X-Priority: 3 X-MSMail-Priority: Normal X-Mailer: Microsoft Outlook Express 5.00.2919.6700 X-MimeOLE: Produced By Microsoft MimeOLE V5.00.2919.6700 Subject: [NDE] (no subject) Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: This is a multi-part message in MIME format. ------=_NextPart_000_0019_01C1BEA6.DD903A70 Content-Type: text/plain; charset="big5" Content-Transfer-Encoding: quoted-printable dear web master, please remove me from the mailing list. thanks. best regrads ------=_NextPart_000_0019_01C1BEA6.DD903A70 Content-Type: text/html; charset="big5" Content-Transfer-Encoding: quoted-printable
dear web master,
 
please remove me from the mailing list.
thanks.
 
best regrads
------=_NextPart_000_0019_01C1BEA6.DD903A70-- From nde-admin@coqui.ccf.swri.edu Mon Feb 25 18:45:02 2002 Path: sn-us!sn-xit-01!supernews.com!newshub2.rdc1.sfba.home.com!news.home.com!pln-w!extra.newsguy.com!lotsanews.com!peernews.mcc.ac.uk!news.mcc.ac.uk!not-for-mail From: "Joe Kelleher" Newsgroups: sci.materials,sci.techniques.testing.nondestructive Date: Tue, 26 Feb 2002 00:43:31 -0000 Organization: University of Manchester Lines: 74 Message-ID: References: <3C783C86.16337F35@revealed.net> <3C792014.1B2124EA@revealed.net> <3C798397.EAECAC5A@revealed.net> Reply-To: "Joe Kelleher" NNTP-Posting-Host: opg174.halls.umist.ac.uk X-Trace: godfrey.mcc.ac.uk 1014684217 58242 130.88.172.174 (26 Feb 2002 00:43:37 GMT) X-Complaints-To: usenet@godfrey.mcc.ac.uk NNTP-Posting-Date: 26 Feb 2002 00:43:37 GMT X-Priority: 3 X-MSMail-Priority: Normal X-Newsreader: Microsoft Outlook Express 5.50.4133.2400 X-MimeOLE: Produced By Microsoft MimeOLE V5.50.4133.2400 Xref: sn-us sci.materials:46101 sci.techniques.testing.nondestructive:5751 To: nde@coqui.ccf.swri.edu Subject: [NDE] Re: Surface preparation of plain carbon steel for X-ray residual stress measurement Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: "jbuch" wrote > I have long wanted to do residual stress work. For my PhD, I did "The > Dislocation Analysis of Stress" in which I derived the dislocation > distributions that would correspond to an arbitrary residual stress > distribution. I'd be most interested to see a copy of this work (have you please got an electronic copy to hand?), especially as some of the theory behind rolling contact fatigue considers work hardening along with residual stress. I'd also like to know the best way to represent an arbitrary residual stress field mathematically. When people present residual stress measurement results, they usually just quote some or all of the tensor components at each point that they did a measurement. Is there a better way than this, that describes a continuous residual stress field? For example, if I do a simple experiment where I get one result, y, for each value of an input variable, x, then I can plot a graph of y against x with some points on it. I can then find a line of best fit, a straight line or perhaps a polynomial function y=f(x), since polynomials can approximate most other functions and it's possible to calculate best fits to any data set. By then using this function instead of my original data, I can find a prediced value y for any value of x. But this function only has one input variable (x) and one output variable (y). Is there a type of function that will take 3 input variables (x, y and z, the 3D coordinates of a point in a specimen), and return 6 output variables (the components of the stress tensor at that point)? A function that could be best fitted onto some residual stress data? I accept that such function need not return zero for coordinates outside the specimen... > Tensor descriptions of all fields, of course. Hairy math, but I was > young and impressed by math. I'm impressed by the potential usefulness of the mathematics in this area, but I sometimes get the impression that the mathematicians who designed it didn't have ease of use in mind. It doesn't help that vector, tensor and matrix algebra are similar enough to have the same concepts, terminology and formal definitions, but different enough to have apparently unrelated practical meanings. For example, I thought I knew what an 'eigenvector' was until I looked it up in a textbook covering only matrix algebra. In fairness, since the age of about 18 I've only bothered learing the maths necessary for whatever scientific work I've been involved with. > I have long felt that we have a lot to learn from understanding the > residual stress and the dislocations causing the effects. I agree, but half the problem seems to be we have a lot to learn before we can understand exactly what effects the residual stresses and dislocations will have. Part of what my sponsors are interested in is which locations and directions of residual stress are most important in causing and preventing different types of rail damage. Something better than "the compressive stresses should be near the surface". I don't think they're trying to control those residual stress, rather, simply to pick an NDT method and procedure that's best suited to detecting only those stresses which make a difference. > But mostly my attention used to be on simple loadings like a single > bend or two, not the literally millions of heavy load cycles that in > service rails get. Rails are quite a specific application where many mechanical damage mechanisms are acting, and interacting with each other. Thus, most published observations tend to be empirical and deductive, looking at easily observable things like wear profiles and crack directions, and then attempting to explain them in terms of microstructure and residual stress, etc. Definite theoretically-derived correlations between things grain size, stress fields, plastic strain rate in service etc. are interesting, but published less often. Joe Kelleher University of Manchester, UK jfk (at) bitsmart (dot) com From nde-admin@coqui.ccf.swri.edu Mon Feb 25 19:25:07 2002 Path: sn-us!sn-xit-03!supernews.com!logbridge.uoregon.edu!pln-w!spln!dex!extra.newsguy.com!newsp.newsguy.com!enews4 From: jbuch Newsgroups: sci.materials,sci.techniques.testing.nondestructive Date: Mon, 25 Feb 2002 19:05:24 -0600 Organization: NB Research Lines: 72 Message-ID: <3C7ADF54.B2B6A15F@revealed.net> References: <3C783C86.16337F35@revealed.net> <3C792014.1B2124EA@revealed.net> <3C798397.EAECAC5A@revealed.net> NNTP-Posting-Host: p-184.newsdawg.com Mime-Version: 1.0 Content-Type: text/plain; charset=us-ascii Content-Transfer-Encoding: 7bit X-Mailer: Mozilla 4.76 [en]C-PBI-NC404 (Win95; U) X-Accept-Language: en Xref: sn-us sci.materials:46102 sci.techniques.testing.nondestructive:5753 To: nde@coqui.ccf.swri.edu Subject: [NDE] Re: Surface preparation of plain carbon steel for X-ray residual stress measurement Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: Joe Kelleher wrote: > > "jbuch" wrote > > > I have long wanted to do residual stress work. For my PhD, I did "The > > Dislocation Analysis of Stress" in which I derived the dislocation > > distributions that would correspond to an arbitrary residual stress > > distribution. > > I'd be most interested to see a copy of this work (have you please got an > electronic copy to hand?), especially as some of the theory behind rolling > contact fatigue considers work hardening along with residual stress. I was one of those few who never bothered to publish papers from the PhD. They changed the requirements after that and make submission of a publication manuscript compulsory after I got away. The microfilms archive "The Dislocation Analysis of Stress" J. Buch (1968) Northwestern Univ. > > I'd also like to know the best way to represent an arbitrary residual stress > field mathematically. In a sense, this is a can of worms.... If you are lucky, experimentally you can represent the six independent components for one single point. At other times, you may be able to make a map for some of the components illustrating how it varies with distance. Mostly, 3D distributions of arbitrary stress are calculated or conjectured rather than measured. Just too much darn data. Kind of the ultimate dirty little secret of solid mechanics... for the most part, we will be able to measure and handle only a small fraction of the physical reality. > When people present residual stress measurement > results, they usually just quote some or all of the tensor components at > each point that they did a measurement. Is there a better way than this, > that describes a continuous residual stress field? For example, if I do a > simple experiment where I get one result, y, for each value of an input > variable, x, then I can plot a graph of y against x with some points on it. > I can then find a line of best fit, a straight line or perhaps a polynomial > function y=f(x), since polynomials can approximate most other functions and > it's possible to calculate best fits to any data set. By then using this > function instead of my original data, I can find a prediced value y for any > value of x. But this function only has one input variable (x) and one output > variable (y). Is there a type of function that will take 3 input variables > (x, y and z, the 3D coordinates of a point in a specimen), and return 6 > output variables (the components of the stress tensor at that point)? A > function that could be best fitted onto some residual stress data? I accept > that such function need not return zero for coordinates outside the > specimen... > Joe Kelleher > University of Manchester, UK > jfk (at) bitsmart (dot) com -- ----------------------------------------------- A keepsake quality gift for young girls, A personalized adventure book: http://www.youralicebook.com FREE__ Screensavers and Software to stretch the budget this Christmas. http://www.YourAliceBook.com/WhatsHere/FreeSoftware.htm From nde-admin@coqui.ccf.swri.edu Mon Feb 25 19:30:10 2002 Path: sn-us!sn-xit-06!supernews.com!novia!novia!fu-berlin.de!server1.netnews.ja.net!warwick!peernews.mcc.ac.uk!news.mcc.ac.uk!not-for-mail From: "Joe Kelleher" Newsgroups: sci.materials,sci.techniques.testing.nondestructive Date: Tue, 26 Feb 2002 01:28:43 -0000 Organization: University of Manchester Lines: 79 Message-ID: References: <3C783C86.16337F35@revealed.net> <3C792014.1B2124EA@revealed.net> <3C798397.EAECAC5A@revealed.net> <3C7A5ABB.679F107F@lanl.gov> Reply-To: "Joe Kelleher" NNTP-Posting-Host: opg174.halls.umist.ac.uk X-Trace: godfrey.mcc.ac.uk 1014686924 59343 130.88.172.174 (26 Feb 2002 01:28:44 GMT) X-Complaints-To: usenet@godfrey.mcc.ac.uk NNTP-Posting-Date: 26 Feb 2002 01:28:44 GMT X-Priority: 3 X-MSMail-Priority: Normal X-Newsreader: Microsoft Outlook Express 5.50.4133.2400 X-MimeOLE: Produced By Microsoft MimeOLE V5.50.4133.2400 Xref: sn-us sci.materials:46103 sci.techniques.testing.nondestructive:5754 To: nde@coqui.ccf.swri.edu Subject: [NDE] Re: Surface preparation of plain carbon steel for X-ray residual stress measurement Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: "Mike Prime" wrote > > Joe Kelleher wrote: > > > > > > Some people in my department want me to use Michael B. > > > Prime's EDM-cut-it-and-look-at-the-surface-profile residual stress > > > measurement method, to give me the longitudinal stresses, > > > which I'd like to try because getting the longitudinal stress is > > > usually more difficult with most other methods. > > Of course, I think that's a great idea, but I'm hardly objective. :-) > Some info on this method at: http://www.lanl.gov/contour/ Thanks, that's refreshingly well explained for an experimental technique. Those 2 papers had previously been given to me by my supervisor. I notice in one of them you say if I don't make the cut perpendicular to a principal stress direction, then the shear stresses will 'cancel out' - as one exposed surface moves in one direction as a result of shear stress relief, the other surface will move in the opposite direction (did I understand that right?) Would it be possible to measure these shear stresses by image correlating the two exposed surfaces? Or would there not be enough detail left on the two surfaces to match up? > Two things to keep in mind: > 1) The contour method can give a great map of the longitudinal > residual stresses over the whole cross section EXCEPT right near surface > because the assumption of a flat cut is not great right near the > surface. If you need those, use x-ray around the perimeter before you cut it. Does 'near the surface' mean as close as the penetration depth of x-rays? If so, I don't think that would be a problem anyway, although I expect I will do x-ray and/or magnetic measurements there. > 2) You could actually use the contour method to get all 3 stress components. The > same FEM calculation that tells you the longitudinal stresses from the measured > surface contour also tells you how the other stress components have changed. So if > you subsequently measure the surface stresses using x-ray (you still have your > electropolish problem to deal with), you can get the 3 components of normal > stress. This is described briefly in the journal article on the contour method > (preprint on web page, this is just A+B=C in Figure 1). I'm in the process of > experimentally proving this multiple stress component capability, but it will take > more than a year to get it published. For now, you'll have to take my word on it. This would be useful, as I'd like a way to predict how the biaxial measurements on a cut rail cross-section relate to those before I made any cut. The simplest theory says they are the same, because the longitudinal direction is a principal stress direction. I don't believe that's necessarily true at all points, and even if it were, longitudinal stress relaxation could cause an effect on the other two principal stresses via a Poisson's ratio effect, if I understand correctly. > As far the the electropolish, we've had some luck on big steel pieces using 70 vol > % sulfuric, 3 wt % chromic acid at room temp. I'll give it a try. What sort of voltage is required? > Best of luck. I'm glad to answer any more questions. Thanks, I'm sure I'll have some more... Joe Kelleher University of Manchester, UK jfk (at) bitsmart (dot) com From nde-admin@coqui.ccf.swri.edu Mon Feb 25 14:40:09 2002 Path: sn-us!sn-xit-03!supernews.com!newsswitch.lcs.mit.edu!news.uchicago.edu!newsfeed.cs.wisc.edu!nnxp1.twtelecom.net!news-east.rr.com!cyclone.kc.rr.com!news.kc.rr.com!cyclone3.kc.rr.com!news3.kc.rr.com!twister.rdc-kc.rr.com.POSTED!not-for-mail From: "DocHoliday" Newsgroups: sci.techniques.testing.nondestructive Lines: 100 MIME-Version: 1.0 Content-Type: multipart/alternative; boundary="----=_NextPart_000_00D1_01C1B9EA.ECA1D840" X-Priority: 3 X-MSMail-Priority: Normal X-Newsreader: Microsoft Outlook Express 6.00.2600.0000 X-MimeOLE: Produced By Microsoft MimeOLE V6.00.2600.0000 Message-ID: <9FOc8.4490$kq1.1912063@twister.rdc-kc.rr.com> Date: Wed, 20 Feb 2002 14:46:29 GMT NNTP-Posting-Host: 65.31.151.96 X-Complaints-To: abuse@rr.com X-Trace: twister.rdc-kc.rr.com 1014216389 65.31.151.96 (Wed, 20 Feb 2002 08:46:29 CST) NNTP-Posting-Date: Wed, 20 Feb 2002 08:46:29 CST Xref: sn-us sci.techniques.testing.nondestructive:5749 To: nde@coqui.ccf.swri.edu Subject: [NDE] What else but a test..... Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: This is a multi-part message in MIME format. ------=_NextPart_000_00D1_01C1B9EA.ECA1D840 Content-Type: text/plain; charset="Windows-1252" Content-Transfer-Encoding: quoted-printable ------=_NextPart_000_00D1_01C1B9EA.ECA1D840 Content-Type: text/html; charset="Windows-1252" Content-Transfer-Encoding: quoted-printable
 





------=_NextPart_000_00D1_01C1B9EA.ECA1D840-- From nde-owner Tue Feb 26 08:54:46 2002 Received: from viruswall.ccf.swri.edu (localhost [127.0.0.1]) by coqui.ccf.swri.edu (8.11.2/8.11.2) with ESMTP id g1QEskg02695 for ; Tue, 26 Feb 2002 08:54:46 -0600 (CST) Received: from mailhub.ccf.swri.edu (localhost [127.0.0.1]) by viruswall.ccf.swri.edu (8.10.2+Sun/8.10.2) with ESMTP id g1QEsjm22381 for ; Tue, 26 Feb 2002 08:54:45 -0600 (CST) Received: from eis-msg-012.jpl.nasa.gov (eis-msg-012.jpl.nasa.gov [137.78.160.40]) by mailhub.ccf.swri.edu (8.11.2/8.11.2) with ESMTP id g1QEsiT04487 for ; Tue, 26 Feb 2002 08:54:44 -0600 (CST) Received: from BAR-COHEN.jpl.nasa.gov (barcohen.jpl.nasa.gov [128.149.135.56]) by eis-msg-012.jpl.nasa.gov (8.12.1/8.12.1) with ESMTP id g1QEshol007710 for ; Tue, 26 Feb 2002 06:54:43 -0800 (PST) Message-Id: <5.1.0.14.2.20020225080836.057b1260@pop.jpl.nasa.gov> X-Sender: barcohen@pop.jpl.nasa.gov X-Mailer: QUALCOMM Windows Eudora Version 5.1 Date: Mon, 25 Feb 2002 12:35:30 -0800 To: nde@coqui.ccf.swri.edu From: Yoseph Bar-Cohen Mime-Version: 1.0 Content-Type: multipart/alternative; boundary="=====================_312036000==_.ALT" Subject: [NDE] 2002 Transducing Materials and Devices -- Call for Papers Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: --=====================_312036000==_.ALT Content-Type: text/plain; charset="us-ascii"; format=flowed Dear Colleague, I am pleased to inform you of the first Transducing Materials and Devices Conference and I would like to invite you to submit an abstract. This international conference is an exciting opportunity for technical interactions and information exchange among developers and users of this multidisciplinary field that is very important to many areas of science and engineering. The conference is going to be held on Oct. 31 - Nov. 1, 2002 at Brugge, Belgium, and it is described on: http://spie.org/conferences/calls/02/epf/confs/PF11.html . This conference is part of the SPIE's Photonics Fabrication Europe Symposium, which is described on http://spie.org/conferences/calls/02/epf/ Submittal of abstracts is due on April 1, 2002 and the manuscript will be due on September 30, 2002. The Abstract Submission Form is available on http://butler2.spie.org/abstracts/Absin.lasso?-token=PF11 Yosi , Conference Chair ______________________________________________ Yoseph Bar-Cohen, Ph.D. , Senior Research Scientist Group Leader, NDEAA Technologies, M&RT Adjunct Professor, UCLA, MAE Dept. Jet Propulsion Lab (JPL), 82-105 4800 Oak Grove Dr., Pasadena, CA 91109-8099 818-354-2610, Fax: 818-393-3254 yosi@jpl.nasa.gov http://ndeaa.jpl.nasa.gov ------------------------------------------------------------------------------- --=====================_312036000==_.ALT Content-Type: text/html; charset="us-ascii" Dear Colleague,

I am pleased to inform you of the first Transducing Materials and Devices Conference and I would like to invite you to submit an abstract.  This international conference is an exciting opportunity for technical interactions and information exchange among developers and users of this multidisciplinary field that is very important to many areas of science and engineering.  The conference is going to be held on Oct. 31 - Nov. 1, 2002 at Brugge, Belgium, and it is described on: http://spie.org/conferences/calls/02/epf/confs/PF11.html .  This conference is part of the SPIE's Photonics Fabrication Europe Symposium, which is described on http://spie.org/conferences/calls/02/epf/

Submittal of abstracts is due on April 1, 2002 and the manuscript will be due on September 30, 2002.  The Abstract Submission Form is available on http://butler2.spie.org/abstracts/Absin.lasso?-token=PF11

Yosi , Conference Chair

______________________________________________
   Yoseph Bar-Cohen, Ph.D. , Senior Research Scientist                                                    
   Group Leader, NDEAA Technologies, M&RT           
   Adjunct Professor, UCLA, MAE Dept.                                                  
   Jet Propulsion Lab (JPL), 82-105                                        
   4800 Oak Grove Dr., Pasadena, CA 91109-8099             
   818-354-2610,                       Fax: 818-393-3254                     
   yosi@jpl.nasa.gov          http://ndeaa.jpl.nasa.gov
-------------------------------------------------------------------------------
--=====================_312036000==_.ALT-- From nde-admin@coqui.ccf.swri.edu Tue Feb 26 10:15:06 2002 Path: sn-us!sn-xit-03!supernews.com!nntp.cs.ubc.ca!newsfeed.stanford.edu!logbridge.uoregon.edu!news.uoregon.edu!not-for-mail From: Mike Prime Newsgroups: sci.materials,sci.techniques.testing.nondestructive Date: Tue, 26 Feb 2002 09:06:34 -0700 Organization: ESA division, Los Alamos National Laboratory Lines: 66 Message-ID: <3C7BB28A.8C308260@lanl.gov> References: <3C783C86.16337F35@revealed.net> <3C792014.1B2124EA@revealed.net> <3C798397.EAECAC5A@revealed.net> <3C7A5ABB.679F107F@lanl.gov> NNTP-Posting-Host: hatchet.esa.lanl.gov Mime-Version: 1.0 Content-Type: text/plain; charset=us-ascii Content-Transfer-Encoding: 7bit X-Trace: pith.uoregon.edu 1014739641 25863 128.165.140.122 (26 Feb 2002 16:07:21 GMT) X-Complaints-To: news@news.uoregon.edu NNTP-Posting-Date: Tue, 26 Feb 2002 16:07:21 +0000 (UTC) X-Mailer: Mozilla 4.79 [en] (Windows NT 5.0; U) X-Accept-Language: en Xref: sn-us sci.materials:46106 sci.techniques.testing.nondestructive:5755 To: nde@coqui.ccf.swri.edu Subject: [NDE] Re: Surface preparation of plain carbon steel for X-ray residual stress measurement Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: Hopefully, this message gets the quotations correct. Joe's messages don't show up on my newsreader, so I have to cut and paste from Google in a reply to my own message. > > Joe Kelleher wrote: > I notice in > one of them you say if I don't make the cut perpendicular to a principal > stress direction, then the shear stresses will 'cancel out' - as one exposed > surface moves in one direction as a result of shear stress relief, the other > surface will move in the opposite direction (did I understand that right?) That is correct. > Would it be possible to measure these shear stresses by image correlating > the two exposed surfaces? Or would there not be enough detail left on the > two surfaces to match up? If you could somehow measure the transverse displacements, you could indeed get those shear stresses. I have no experience with image correlation, but it may not work. The EDM cut is finite width, so the two cut surfaces are actually planes separated by 100+ microns in the original material. Plus the surfaces are rough from the cut. There may not be enough information to correlate. > > Two things to keep in mind: > > 1) The contour method can give a great map of the longitudinal > > residual stresses over the whole cross section EXCEPT right near surface > > because the assumption of a flat cut is not great right near the > > surface. If you need those, use x-ray around the perimeter before you cut > it. > > Does 'near the surface' mean as close as the penetration depth of x-rays? If > so, I don't think that would be a problem anyway, although I expect I will > do x-ray and/or magnetic measurements there. > A bit more than the x-ray depth. It depends on the EDM cut, but the last 100-500 microns of the surface will be rounded off by the cutting and not give useful data. > > 2) You could actually use the contour method to get all 3 stress components. The > > same FEM calculation that tells you the longitudinal stresses from the measured > > surface contour also tells you how the other stress components have changed. > > This would be useful, as I'd like a way to predict how the biaxial > measurements on a cut rail cross-section relate to those before I made any > cut. The simplest theory says they are the same, because the longitudinal > direction is a principal stress direction. I don't believe that's > necessarily true at all points, and even if it were, longitudinal stress > relaxation could cause an effect on the other two principal stresses via a > Poisson's ratio effect, if I understand correctly. > If there were longitudinal stresses, than the sectioning will change the other stresses. Only if the longitudinal stresses are zero do the in-plane stresses stay the same after sectioning. > > As far the the electropolish, we've had some luck on big steel pieces using 70 vol > > % sulfuric, 3 wt % chromic acid at room temp. > > I'll give it a try. What sort of voltage is required? > I think they used 14 volts. This e-polish is not perfectly smooth, it has some preferential material removal, but it seems to be good enough to get good x-ray results. Mike From nde-admin@coqui.ccf.swri.edu Tue Feb 26 10:20:10 2002 Path: sn-us!sn-xit-03!supernews.com!nntp.cs.ubc.ca!logbridge.uoregon.edu!news.uoregon.edu!not-for-mail From: Mike Prime Newsgroups: sci.materials,sci.techniques.testing.nondestructive Date: Tue, 26 Feb 2002 09:17:01 -0700 Organization: ESA division, Los Alamos National Laboratory Lines: 29 Message-ID: <3C7BB4FC.9D05F9E@lanl.gov> References: <3C783C86.16337F35@revealed.net> <3C792014.1B2124EA@revealed.net> <3C798397.EAECAC5A@revealed.net> <3C7ADF54.B2B6A15F@revealed.net> NNTP-Posting-Host: hatchet.esa.lanl.gov Mime-Version: 1.0 Content-Type: text/plain; charset=us-ascii Content-Transfer-Encoding: 7bit X-Trace: pith.uoregon.edu 1014740268 25893 128.165.140.122 (26 Feb 2002 16:17:48 GMT) X-Complaints-To: news@news.uoregon.edu NNTP-Posting-Date: Tue, 26 Feb 2002 16:17:48 +0000 (UTC) X-Mailer: Mozilla 4.79 [en] (Windows NT 5.0; U) X-Accept-Language: en Xref: sn-us sci.materials:46107 sci.techniques.testing.nondestructive:5756 To: nde@coqui.ccf.swri.edu Subject: [NDE] Re: Surface preparation of plain carbon steel for X-ray residual stress measurement Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: > Joe Kelleher wrote: > > > > I'd also like to know the best way to represent an arbitrary residual stress > > field mathematically. An extremely useful way of representing a residual stress field, especially when you are concerned about changes after cutting or sectioning is "inherent strain" or "eigenstrain." Ueda is the main inventor/practicioner, but I find that it is most simply explained in the thesis of Mike Hill, who is now a professor at U.C. Davis. You can download the thesis at: http://mae.ucdavis.edu/~mhill/thesis.html A brief, if inadequate summary: Eigenstrain is the incompatible strain field that gives rise to residual stresses. Residual stresses change after sectioning, but the eigenstrain does not. You can calculate residual stresses from eigenstrain. You can measure, at least to an extent, the eigenstrain in a sectioned part and calculate the residual stresses in the original, unsectioned part. jbuch wrote: > In a sense, this is a can of worms.... If you are lucky, experimentally > you can represent the six independent components for one single point. Quite right. No matter what you do, you will have to make some compromises. Mike From nde-admin@coqui.ccf.swri.edu Wed Feb 27 19:20:22 2002 Path: sn-us!sn-xit-03!supernews.com!logbridge.uoregon.edu!pln-w!extra.newsguy.com!lotsanews.com!peernews.mcc.ac.uk!news.mcc.ac.uk!not-for-mail From: "Joe Kelleher" Newsgroups: sci.materials,sci.techniques.testing.nondestructive Date: Thu, 28 Feb 2002 01:13:01 -0000 Organization: University of Manchester Lines: 59 Message-ID: References: <3C783C86.16337F35@revealed.net> <3C792014.1B2124EA@revealed.net> <3C798397.EAECAC5A@revealed.net> <3C7A5ABB.679F107F@lanl.gov> <3C7BB28A.8C308260@lanl.gov> Reply-To: "Joe Kelleher" NNTP-Posting-Host: opg174.halls.umist.ac.uk X-Trace: godfrey.mcc.ac.uk 1014858772 44265 130.88.172.174 (28 Feb 2002 01:12:52 GMT) X-Complaints-To: usenet@godfrey.mcc.ac.uk NNTP-Posting-Date: 28 Feb 2002 01:12:52 GMT X-Newsreader: Microsoft Outlook Express 5.50.4133.2400 X-MimeOLE: Produced By Microsoft MimeOLE V5.50.4133.2400 Xref: sn-us sci.materials:46123 sci.techniques.testing.nondestructive:5758 To: nde@coqui.ccf.swri.edu Subject: [NDE] Re: Surface preparation of plain carbon steel for X-ray residual stress measurement Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: "Mike Prime" wrote > Hopefully, this message gets the quotations correct. Joe's messages don't show up on > my newsreader, so I have to cut and paste from Google in a reply to my own message. Are they never even reaching your news server, or do they just not display correctly? If Manchester Uni's news server turns out to be inadequately connected to the rest of the internet, I'll look into using another one. > > Would it be possible to measure these shear stresses by image correlating > > the two exposed surfaces? Or would there not be enough detail left on the > > two surfaces to match up? > > If you could somehow measure the transverse displacements, you could indeed get those > shear stresses. I have no experience with image correlation, but it may not work. The > EDM cut is finite width, so the two cut surfaces are actually planes separated by 100+ > microns in the original material. Plus the surfaces are rough from the cut. There may > not be enough information to correlate. As an image correlation exercise, the setup is far from ideal. But the chance to get 3 of the 6 tensor components, whilst predicting the change in the other 3 that can now be measured, seems worth persuing. Reducing the finite width of the EDM is probably impractical. Another possibility would be to use an image correlation algorithm that only looked for features bigger than the cut width in the material in question, and allowed for the fact these features still may not appear on both surfaces. But that's assuming that the material has any microstructural features of the required size. The only other thing I can think of (and I really am guessing here...) would be to find a relationship between the roughness profiles of the two surfaces, i.e., assume that a microscopic peak on one side is correlated with either a peak or trough on the other side. If so, it might be possible to deliberately introduce roughness features, such as by periodically providing a brief pulse of extra current to the EDM. It might then be possible measure these features with the same profilometer that measures the original contours. In case it's not already obvious, I've never even seen an EDM cutter before. > If there were longitudinal stresses, than the sectioning will change the other > stresses. Only if the longitudinal stresses are zero do the in-plane stresses stay the > same after sectioning. Thanks, I suspected as much. Joe Kelleher University of Manchester, UK jfk (at) bitsmart (dot) com From nde-admin@coqui.ccf.swri.edu Thu Feb 28 06:15:04 2002 Path: sn-us!sn-xit-06!supernews.com!priapus.visi.com!news-out.visi.com!hermes.visi.com!news.maxwell.syr.edu!newsfeed.stanford.edu!canoe.uoregon.edu!logbridge.uoregon.edu!pln-w!extra.newsguy.com!lotsanews.com!peernews.mcc.ac.uk!news.mcc.ac.uk!not-for-mail From: "Joe Kelleher" Newsgroups: sci.materials,sci.techniques.testing.nondestructive Date: Thu, 28 Feb 2002 12:14:28 -0000 Organization: Sirius Cybernetics Corporation Lines: 38 Message-ID: References: <3C783C86.16337F35@revealed.net> <3C792014.1B2124EA@revealed.net> <3C798397.EAECAC5A@revealed.net> <3C7ADF54.B2B6A15F@revealed.net> NNTP-Posting-Host: pw14.mt.umist.ac.uk X-Trace: godfrey.mcc.ac.uk 1014898193 89860 130.88.136.7 (28 Feb 2002 12:09:53 GMT) X-Complaints-To: usenet@godfrey.mcc.ac.uk NNTP-Posting-Date: 28 Feb 2002 12:09:53 GMT X-Priority: 3 X-MSMail-Priority: Normal X-Newsreader: Microsoft Outlook Express 5.00.2615.200 X-MimeOLE: Produced By Microsoft MimeOLE V5.00.2615.200 Xref: sn-us sci.materials:46127 sci.techniques.testing.nondestructive:5759 To: nde@coqui.ccf.swri.edu Subject: [NDE] Re: Surface preparation of plain carbon steel for X-ray residual stress measurement Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.edu X-Mailman-Version: 2.0.6 Precedence: bulk List-Help: List-Post: List-Subscribe: , List-Id: Nondestructive Evaluation (NDE) List-Unsubscribe: , List-Archive: jbuch wrote > I was one of those few who never bothered to publish papers from the > PhD. They changed the requirements after that and make submission of a > publication manuscript compulsory after I got away. The microfilms > archive "The Dislocation Analysis of Stress" J. Buch (1968) Northwestern Univ. Nothing in Word or PDF format then :-( > > I'd also like to know the best way to represent an arbitrary residual stress > > field mathematically. > > In a sense, this is a can of worms.... If you are lucky, experimentally > you can represent the six independent components for one single point. > > At other times, you may be able to make a map for some of the components > illustrating how it varies with distance. The technology I'm working with is probably at the level where my supervisors are expecting to see a 2d map of stress on a surface, measuring 1, 2 or all 3 of the components that can be measured there. I want to measure all 3, naturally. I think this is enough for it to be worthwhile performing some mathematical analysis of the fields. For example, one advantage of being able to describe such a stress field with a mathematical function is that I simply have to solve the function for a certain value of stress, in order to get the equation for a stress contour line for a contour plot. Contour plots often easier to understand (and neater for presentation purposes) than quoting the measurements at individual points, especially where the points you took your measurements are unevenly spaced. Joe Kelleher University of Manchester, UK jfk (at) bitsmart (dot) com From nde-admin@coqui.ccf.swri.edu Thu Feb 28 16:00:18 2002 Path: sn-us!sn-xit-04!supernews.com!216.227.56.88.MISMATCH!DirecTVinternet!DirecTV-DSL!hub1.nntpserver.com!nntp-relay.ihug.net!ihug.co.nz!logbridge.uoregon.edu!news.uoregon.edu!not-for-mail From: Mike Prime Newsgroups: sci.materials,sci.techniques.testing.nondestructive Date: Thu, 28 Feb 2002 14:53:38 -0700 Organization: ESA division, Los Alamos National Laboratory Lines: 46 Message-ID: <3C7EA6E2.1066085C@lanl.gov> References: <3C783C86.16337F35@revealed.net> <3C792014.1B2124EA@revealed.net> <3C798397.EAECAC5A@revealed.net> <3C7A5ABB.679F107F@lanl.gov> <3C7BB28A.8C308260@lanl.gov> NNTP-Posting-Host: hatchet.esa.lanl.gov Mime-Version: 1.0 Content-Type: text/plain; charset=us-ascii Content-Transfer-Encoding: 7bit X-Trace: pith.uoregon.edu 1014933270 1775 128.165.140.122 (28 Feb 2002 21:54:30 GMT) X-Complaints-To: news@news.uoregon.edu NNTP-Posting-Date: Thu, 28 Feb 2002 21:54:30 +0000 (UTC) X-Mailer: Mozilla 4.79 [en] (Windows NT 5.0; U) X-Accept-Language: en Xref: sn-us sci.materials:46134 sci.techniques.testing.nondestructive:5760 To: nde@coqui.ccf.swri.edu Subject: [NDE] Re: Surface preparation of plain carbon steel for X-ray residual stress measurement Sender: nde-admin@coqui.ccf.swri.edu Errors-To: nde-admin@coqui.ccf.swri.edu X-BeenThere: nde@coqui.ccf.swri.