From jay.fisher@swri.edu  Sat Apr  1 23:35:31 2006
From: jay.fisher@swri.edu (Jay Fisher)
Date: Sat, 01 Apr 2006 17:35:31 -0600
Subject: [NDE] The 4th  International  Workshop on Ultrasonic and Advanced Methods
 for Nondestructive Testing and Material CharacterizationThe 4th  International
 Workshop on Ultrasonic and Advanced Methods for Nondestructive Testing and
 Material Characterization
Message-ID: <442F0E43.3080004@swri.edu>

The 4th  International  Workshop on Ultrasonic and Advanced Methods for 
Nondestructive Testing and Material Characterization

Time: Monday, June 19, 2006.
Location:  Univ. of Massachusetts Dartmouth, at N. Dartmouth MA;
     Room 101 of Textile Science Building (College of Engineering 
Conference Room)
    
The 4rd workshop will again emphasize on theory and applications of 
ultrasonic and advanced methods for nondestructive testing and material 
characterization.  Speakers are invited in these and related areas.  A 
conference proceedings publication is planned for this meeting.  A 
preliminary list of talks includes:

"Acoustical nonlinear imaging and its application in tissue 
characterization". Prof. Dong Zhang, Institute of Acoustics, Nanjing 
Univesity, Nanjing 210093, People's Republic of China
"Angular spectrum decomposition analysis of 2nd harmonic ultrasound 
propagation and its relation to Tissue Harmonic Imaging", Dr. Xiang Yan, 
Olympus NDT, Waltham, MA
"Integrated and flexible piezoelectric/ultrasonic transducers", by Dr. 
Makiko Kobayashi and Dr. Cheng-Kuei Jen, Industrial Materials Institute, 
National Research Council of Canada, Boucherville, Quebec, Canada J4B 6Y4.
"A review of ultrasonic characterization methods for thin layer materials",
Prof. C.H. Chen, NDE Lab., UMass Dartmouth, Dartmouth, MA
"Terahertz NDE and applications", Mr. Robert F. Anastasi, Army 
Research   Laboratory, Hampton, VA.
"TBA", by Dr. David Zimdars, Manager of Terahertz Research and 
Development, Picometrix, an API Company, Ann Arbor, MI 48104
"Radiography by Selective Detection (RSD) X-Ray Backscatter Imaging
for NDE Applications", Prof. Ed. Dugan, 202 NSC, Box 118300, Nuclear & 
Radiological Engineering, University of Florida, Gainesville, FL  32611;    
      Tel: (352) 392-1401; Fax: (352) 392-3380

There is no registration fee but pre-registration by May 1 is requested. 
For further information, including pre-registration, please contact:
Prof. C.H. Chen,
    Electrical and Computer Engineering Dept.
          Univ. of Massachusetts Dartmouth
    N. Dartmouth, MA.  Cchen@umassd.edu  
    Tel:  (508)999-8475;  Fax: (508)999-8489